Clever fault detection in Photovoltaics
A Talk by Prof. Konrad Mertens (Münster University of Applied Sciences)
About this Talk
Join the zoom meeting here: https://uni-freiburg.zoom.us/j/62933142796?pwd=V1M2UHJrbGpCa1psem1RTDJ6ZndDdz09
In my talk „Clever fault detection in PV-plants“ we will first look at standard-measurements (flasher-measurements, peak-power measurements at site and thermography measurements).
Then electroluminescence measurements are focused. It is shown, how EL-pictures can be optimized even with relatively cheap camera devices.
Afterwards, the phenomenon of potential-induced-degradation is shown and explained.
Finally, we look at dark characteristic-curve-measurements, which is a method to determine solar module faults very quickly.